Research

Current research programs focus on materials for energy technologies, bio-materials for medical technologies, advanced materials for aerospace and defense, and materials for electronics and control technologies. 

 

 

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MSE Research Facilities

The following instruments are housed in the core laboratories comprising the Advanced Materials Characterization Center at HATRC.

• Scanning Electron Microscope with EDAX

  This state-of-the-art field emission Hitachi S-4800 SEM is a truly versatile platform comprising impressive high resolution performance and advanced detection technology. New “Super ExB Filter” collects and separates the various components of pure SE, compositional SE and BSE electron signals.

   

  Resolution	Accelerating voltage 15 kV, working distance 4 mm - 1.0 nm Accelerating voltage 1 kV, working distance 1.5 mm - 2.0 nm
  Magnification	High magnification mode - 100X to 800,000X Low magnification mode - 30X to 2,000X
  Electron Optics	Electron Gun - Cold cathode field emission type Extracting voltage - 0 to 6.5 kV Accelerating voltage - 0.5 to 30 kV Lens - 3-stage electromagnetic lens, reduction type Objective lens aperture - movable aperture Astigmatism correction coil - electromagnetic type Scanning coil - 2-stage electromagnetic-deflection type
  Specimen Stage	Type I 3 axes motor stage Tilt -5 degrees to +70 degrees Rotation 360 degrees (continuous) Specimen size - Max. 150 mm diameter (airlock specimen exchange)
  EDS	The X-MaxN (Oxford Instruments) Silicon Drift Detector (SSD) A range of silicon drift detector (SDD) sizes, from 150 mm2 to 20 mm2 A superb resolution that is independent of sensor size EDS analysis at a point or over user-defined regions (Point&ID), between any two points (LineScan, TruLine, and QuantLine), EDS element mapping (LayerMap, AutoLayer and TruMap), and EDS phase mapping (AutoPhaseMap)

• X-Ray Diffractometer

  The primary feature which distinguishes the Bruker D8 Discover from more traditional XRD tools is two-dimensional X-ray detection. A 2D image contains far more information than a 1D profile, and this advantage is fully utilized with the advanced 2D image processing and 2D diffraction pattern manipulation. Thus the 2D diffraction (XRD2) is a new technique in the field of XRD. The Bruker’s acronym GADDS stands for General Area Detector Diffraction Systems. The D8 Discover is also supplied with an optical laser-video camera system for easy sample alignment, and a high power rotating anode (Cu). 

  The D8 DISCOVER with GADDS combines cutting edge x-ray technology of the highest quality in a truly modular system. The D8 DISCOVER with GADDS can analyze an unrivaled variety of samples within a wide range of XRD2 and SAXS applications. Phase Identification, Phase Quantification, Texture, Stress, High Throughput Screening, MicroDiffraction, Mapping and more can be done faster and more easily on this system.

• Mechanical Testing System
   
• Mask Aligner
   
• Sputtering System
   
• FTIR

  The Agilent Cary 680 FTIR spectrometer is the industry leader in FTIR step scan spectroscopy, making it an essential tool for leading-edge research. The Agilent Cary 680 FTIR spectrometer is ideal for challenging research in polymers, materials, biological compounds and gases, in form of Bulk, thin film, composite, etc.

  • Ultra-high throughput, 57 mm dynamically aligned, 60o air bearing interferometer
  • Standard spectral resolution better than 0.07 cm-1
  • Ultra-fast kinetics >110 spectra/sec
  • Full Spectral range, from UV (50,000 cm-1) to far-IR (10 cm-1)
  • Step-scan
  • Highest signal-to-noise (S/N) performance
• AFM

  The Bruker BioScope Catalyst AFM is positioned on an inverted microscope, allowing for the integration of AFM imaging with optical imaging. This arrangement allows for the imaging of larger samples, including samples on glass slides or in glass bottom dishes. The system is equipped with DAPI (blue), GFP (green) and CY3 (red) filter cubes.

  • X-Y Scan Range: ≥150µm, open-loop or closed-loop operation
  • Z Scan Range: ≥20µm, open-loop or closed-loop operation
  • Deflection Detection: IR super luminescent diode (SLD ), λ=850nm
  • Height Noise: <0.1nm RMS (air); <0.2nm RMS (fluid) (typical with appropriate vibration isolation)
  • Force Noise: Thermally-limited, PicoForce-quality force measurements, <10pN RMS for cantilever with k=20pN/nm
  • XY Sample Stage: Motorized stage with 10x10mm range; includes magnetic sample clamps for 1x3in. slides, 25mm coverslips, 35 and60mm plastic petri dishes, and 50mm glass bottom petri dishes
• Raman System
   
• Hall Effect System (on order)
   
• Class 100 Clean Room

  Deposition	Oerlikon 790+ PECVD Expertech CTR 125 Furnace/LPCVD AJA Orion Magnetron Sputterer Electron Beam Evaporator (Currently offline)
  Etching	Oerlikon Shuttlelock 700  series ICP RIE
  Lithography	Laurell WS-400BZ-6NPP/Lite Spin Coater Karl Suss Microtec CT 62 Spinner Karl Suss MA6 Mask Aligner w/BSA
  Metrology	NanoSpec Nano Metrics NA 109 Reflectometer Veeco FPP5000 four-point probe Alpha Step 500 Surface Profiler
  General Equipment	Binder FD23 Convection Oven Branson 3510 Ultrasonic Cleaner Olympus BX60 Microscope w/ DIC Corning PC-420D Hotplates VWR 7X7 CER Stirrer/Hotplate Sartorius Water Deionization System Nitrogen Purged Dry Boxes ReynoldsTech Fume Hoods

 

Materials Science databases (through OSU-Tulsa Library)

Helmerich Research Center